Invention Grant
US09396782B2 Method for writing to a random access memory (MRAM) cell with improved MRAM cell lifespan 有权
写入具有改进的MRAM单元寿命的随机存取存储器(MRAM)单元的方法

Method for writing to a random access memory (MRAM) cell with improved MRAM cell lifespan
Abstract:
Method for writing to a MRAM cell including a magnetic tunnel junction including a first and second ferromagnetic layer, and a tunnel barrier layer; and a bipolar transistor in electrical connection with one end of the magnetic tunnel junction, the bipolar transistor being arranged for controlling the passing and polarity of a heating current in the magnetic tunnel junction. The method includes a sequence of writing steps, each writing step including passing the heating current in the magnetic tunnel junction such as to heat it to a high temperature threshold; and once the magnetic tunnel junction has reached the high temperature threshold, adjusting a second magnetization of the second ferromagnetic layer for writing a write data; wherein during one of the writing steps, the polarity of the heating current is reversed from one during the subsequent writing step. The method allows for an increased lifespan of the MRAM cell.
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