Invention Grant
- Patent Title: Method of fabricating semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US14452243Application Date: 2014-08-05
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Publication No.: US09443732B1Publication Date: 2016-09-13
- Inventor: Tae Sun Kim , Jaekyung Seo , Kwangsub Yoon , Yura Kim , Yeojin Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Main IPC: G03F7/40
- IPC: G03F7/40 ; H01L21/426 ; H01L21/266 ; H01L29/66 ; H01L21/02

Abstract:
The method may include forming a plurality of fins on a substrate with first and second regions, forming a photoresist pattern to expose the fins of the first region, forming a material layer to cover the fins of first region and the photoresist pattern, chemically reacting the photoresist pattern the material layer to form a supplemental film on a side surface of the photoresist pattern, performing an ion implantation process using the photoresist pattern and the supplemental film as a ion injection mask to form impurity layers in the fins of the first region.
Information query
IPC分类: