Invention Grant
- Patent Title: Electrostatic discharge protection structure capable of preventing latch-up issue caused by unexpected noise
- Patent Title (中): 静电放电保护结构能够防止由意外的噪音引起的闩锁问题
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Application No.: US14986741Application Date: 2016-01-04
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Publication No.: US09443841B2Publication Date: 2016-09-13
- Inventor: Lu-An Chen , Ya-Ting Lin , Tien-Hao Tang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L23/62
- IPC: H01L23/62 ; H01L27/02 ; H01L29/74 ; H01L29/08 ; H01L29/06 ; H01L29/87 ; H01L29/40

Abstract:
An electrostatic discharge protection structure comprises an isolation layer, a high voltage P-well, an N-well, a P-well, a first doped region of N-type conductivity, a second doped region of P-type conductivity, a third doped region of N-type conductivity, a fourth doped region of P-type conductivity, an anode, and a cathode. The isolation layer is disposed on a substrate. The high voltage P-well is disposed on the isolation layer. The N-well is disposed in the high voltage P-well. The P-well is disposed in the high voltage P-well, and the P-well is separated from the N-well. The first and the second doped regions are disposed in the N-well. The third and the fourth doped regions are disposed in the P-well. The anode is electrically connected to the first doped region and the second doped region, and the cathode is electrically connected to the fourth doped region.
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