Invention Grant
US09453876B2 Systems and methods for testing a peripheral interfacing with a processor
有权
用于测试与处理器的外设接口的系统和方法
- Patent Title: Systems and methods for testing a peripheral interfacing with a processor
- Patent Title (中): 用于测试与处理器的外设接口的系统和方法
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Application No.: US13657732Application Date: 2012-10-22
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Publication No.: US09453876B2Publication Date: 2016-09-27
- Inventor: Shawn Gettemy , Wei Yao , Ahmad Al-Dahle
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Gazdzinski & Associates, PC
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/28 ; G06F11/273 ; G09G3/00

Abstract:
Systems and methods for testing a peripheral in accordance with a MIPI protocol are provided. A test system can test a peripheral by providing user-5 specified control over a test processor (which is substantially the same processor the peripheral will interface with when installed) to test, calibrate, or both test and calibrate the peripheral. The test processor can communicate with the peripheral according 10 to the MIPI protocol, thereby effectively providing an actual “in-device” environment for testing and/or calibrating the peripheral.
Public/Granted literature
- US20130110447A1 SYSTEMS AND METHODS FOR TESTING A PERIPHERAL INTERFACING WITH A PROCESSOR Public/Granted day:2013-05-02
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