Invention Grant
- Patent Title: Resistive memory device and method of operating the same
- Patent Title (中): 电阻式存储器件及其操作方法
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Application No.: US14979947Application Date: 2015-12-28
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Publication No.: US09472282B2Publication Date: 2016-10-18
- Inventor: Yong-Kyu Lee , Yeong-Taek Lee , Dae-Seok Byeon , Chi-Weon Yoon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2015-0001179 20150106
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C5/06

Abstract:
A resistive memory device includes a memory cell array that has a plurality of resistive memory cells that are arranged respectively on regions where a plurality of first signal lines and a plurality of second signal lines cross each other. A write circuit is connected to a selected first signal line that is connected to a selected memory cell from among the plurality of memory cells, and provides pulses to the selected memory cell. A voltage detector detects a node voltage at a connection node between the selected first signal line and the write circuit. A voltage generation circuit generates a first inhibit voltage and a second inhibit voltage that are applied respectively to unselected first and second signal lines connected to unselected memory cells from among the plurality of memory cells, and changes a voltage level of the second inhibit voltage based on the node voltage that is detected.
Public/Granted literature
- US20160196876A1 RESISTIVE MEMORY DEVICE AND METHOD OF OPERATING THE SAME Public/Granted day:2016-07-07
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