Invention Grant
- Patent Title: Nonvolatile memory device and method for sensing the same
- Patent Title (中): 非易失性存储器件及其感测方法
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Application No.: US14687409Application Date: 2015-04-15
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Publication No.: US09478302B2Publication Date: 2016-10-25
- Inventor: Mu-Hui Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0099083 20140801
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C16/28 ; G11C7/06 ; G11C11/16 ; G11C11/56 ; G11C13/00 ; G11C11/22

Abstract:
A nonvolatile memory device includes a first resistive memory cell connected to a first word line, a second resistive memory cell connected to a second word line that is different from the first word line, a clamping unit connected between a sensing node and the first resistive memory cell to provide a clamping bias to the first resistive memory cell, a reference current supplying unit connected to the second resistive memory cell to supply a reference current, and a sense amplifier connected to the sensing node to sense a level change of the sensing node, wherein when the first word line is enabled, the second word line is disabled.
Public/Granted literature
- US20160035432A1 NONVOLATILE MEMORY DEVICE AND METHOD FOR SENSING THE SAME Public/Granted day:2016-02-04
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