Invention Grant
- Patent Title: Read and write methods for a resistance change non-volatile memory device
- Patent Title (中): 电阻变化非易失性存储器件的读写方法
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Application No.: US14635297Application Date: 2015-03-02
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Publication No.: US09484090B2Publication Date: 2016-11-01
- Inventor: Yuhei Yoshimoto , Kazuhiko Shimakawa , Ken Kawai , Ryotaro Azuma
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2013-120253 20130606
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C29/02 ; G11C29/00 ; H01L27/24 ; H01L45/00 ; G11C7/06

Abstract:
A selection circuit that selects a memory cell from a memory cell array and a read circuit for reading a resistance state of a resistance change element in the selected memory cell are provided. In memory cells of odd-numbered-layer and even-numbered-layer memory cell arrays that constitute a multilayer memory cell array, each memory cell in any of the layers has a selection element, a first electrode, a first resistance change layer, a second resistance change layer, and a second electrode that are disposed in the same order. Whether the selected memory cell is located in any layer of the multilayer memory cell array, the read circuit applies a voltage to the selected memory cell to perform the reading operation. The voltage applied to the selected memory cell causes the second electrode to become positive with reference to the first electrode in the selected memory cell.
Public/Granted literature
- US20150179251A1 RESISTANCE-CHANGE NONVOLATILE MEMORY DEVICE Public/Granted day:2015-06-25
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