Invention Grant
US09488691B2 Integrated circuit control based on a first sample value and a delayed second sample value
有权
基于第一采样值和延迟的第二采样值的集成电路控制
- Patent Title: Integrated circuit control based on a first sample value and a delayed second sample value
- Patent Title (中): 基于第一采样值和延迟的第二采样值的集成电路控制
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Application No.: US14718294Application Date: 2015-05-21
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Publication No.: US09488691B2Publication Date: 2016-11-08
- Inventor: Juan Echeverri Escobar , Surendra Guntur , Manvi Agarwal , Rinze Ida Mechtildis Peter Meijer
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP14173127 20140619
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/317 ; G01R31/3193 ; H03K3/037

Abstract:
An integrated circuit comprises: a first processing stage comprising processing logic for performing a processing operation on an input signal to generate an output signal, wherein the input signal corresponds to an output signal of a previous processing stage; a first sampling element adapted to sample a first value of said output signal synchronously with a clock signal; a second sampling element adapted to sample a second value of said output signal synchronously with a first delayed clock signal; and a first delayed clock signal generator, adapted to selectively generate said first delayed clock signal in response to a control signal generated in said previous processing stage.
Public/Granted literature
- US20150372666A1 INTEGRATED CIRCUIT Public/Granted day:2015-12-24
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