Invention Grant
- Patent Title: Skew calibration circuit and operation method of the skew calibration circuit
- Patent Title (中): 偏斜校准电路和偏斜校准电路的操作方法
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Application No.: US14792985Application Date: 2015-07-07
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Publication No.: US09503064B2Publication Date: 2016-11-22
- Inventor: Gyeonghan Cha , Han-Kyul Lim , SungJun Kim , Chaeryung Kim , DongUk Park , Younwoong Chung , JungMyung Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2014-0099125 20140801
- Main IPC: H03L7/00
- IPC: H03L7/00 ; H03K3/86 ; G06F1/10 ; H03K5/13 ; H03K5/135 ; H03K5/14

Abstract:
A skew calibration circuit may include a data delay unit receiving first data and a first code, and output delayed first data as second data by delaying the first data according to the first code; a clock delay unit receiving a first clock signal and a second code, and output delayed first clock signal as second clock signal by delaying the first clock signal according to the second code; a multiplexer receiving a clock signal and output the clock signal or an inverted clock signal of the clock signal as a first clock signal in response to a selection signal; and a control logic unit receiving the second data and the second clock signal and control the first code, the second code and the selection signal in response to the second data and the second clock signal.
Public/Granted literature
- US20160036420A1 SKEW CALIBRATION CIRCUIT AND OPERATION METHOD OF THE SKEW CALIBRATION CIRCUIT Public/Granted day:2016-02-04
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