Invention Grant
- Patent Title: Automatic analysis apparatus
- Patent Title (中): 自动分析仪
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Application No.: US14402416Application Date: 2013-05-24
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Publication No.: US09506940B2Publication Date: 2016-11-29
- Inventor: Keiko Yoshikawa , Akihisa Makino
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-126668 20120604
- International Application: PCT/JP2013/064427 WO 20130524
- International Announcement: WO2013/183459 WO 20131212
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N21/51 ; G01N35/00 ; G01N21/49 ; G01N33/86 ; G01N21/82 ; G01N35/04 ; G01N15/06 ; G01N21/25 ; G01N21/15

Abstract:
A configuration of detecting light from the front face of a light source is the best for confirming the variation of a light quantity, but when a plurality of light sources are present, as many detectors for checking a light quantity as the light sources are necessary and the apparatus configuration becomes complex. In the present invention, a detector for checking a light source light quantity is installed in a reaction container transfer mechanism used commonly for a plurality of detection sections, and the light quantities of light sources are checked with the detector.
Public/Granted literature
- US20150147230A1 AUTOMATIC ANALYSIS APPARATUS Public/Granted day:2015-05-28
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