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US09506979B2 Test mode entry interlock 有权
测试模式条目互锁

Test mode entry interlock
摘要:
An integrated circuit having normal and special operating modes includes a mode entry interlock (201) which is enabled by an initialization command and an externally supplied voltage at a first I/O terminal (204) to detect a conflict at the I/O terminal for reducing the likelihood of inadvertent entry into the special operating mode. The mode entry interlock also includes a second I/O terminal (212) for receiving a disassociated software command to enter into the special operating mode, and mode control logic (210, 216) for evaluating the received software command against any detected conflict at the I/O terminal to generate a special operating mode enable signal in response to receiving the first and second input signals only when the detected logic state conflicts with the first logic state.
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