发明授权
- 专利标题: Test mode entry interlock
- 专利标题(中): 测试模式条目互锁
-
申请号: US14243386申请日: 2014-04-02
-
公开(公告)号: US09506979B2公开(公告)日: 2016-11-29
- 发明人: William E. Edwards , John M. Hall
- 申请人: Freescale Semiconductor, Inc.
- 申请人地址: US TX Austin
- 专利权人: Freescale Semiconductor, Inc.
- 当前专利权人: Freescale Semiconductor, Inc.
- 当前专利权人地址: US TX Austin
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R31/317 ; H04L1/00 ; G06F1/00
摘要:
An integrated circuit having normal and special operating modes includes a mode entry interlock (201) which is enabled by an initialization command and an externally supplied voltage at a first I/O terminal (204) to detect a conflict at the I/O terminal for reducing the likelihood of inadvertent entry into the special operating mode. The mode entry interlock also includes a second I/O terminal (212) for receiving a disassociated software command to enter into the special operating mode, and mode control logic (210, 216) for evaluating the received software command against any detected conflict at the I/O terminal to generate a special operating mode enable signal in response to receiving the first and second input signals only when the detected logic state conflicts with the first logic state.
公开/授权文献
- US20150285858A1 Test Mode Entry Interlock 公开/授权日:2015-10-08
信息查询