Invention Grant
- Patent Title: Apparatus for reducing the effect of contamination on a rapid thermal process
- Patent Title (中): 用于减少污染对快速热过程的影响的装置
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Application No.: US14550781Application Date: 2014-11-21
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Publication No.: US09514969B2Publication Date: 2016-12-06
- Inventor: Aaron Miller , Mehran Behdjat , Norman L. Tam , Michael Liu
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/66 ; H01L21/324 ; H01L21/687

Abstract:
Embodiments of the present disclosure provide a cover assembly that includes a cover disposed between a device side surface of a substrate and a reflector plate, which are disposed within a thermal processing chamber. The presence of the cover between the device side surface of a substrate and a reflector plate has many advantages over conventional thermal processing chamber designs, which include an improved temperature uniformity during processing, a reduced chamber down time and an improved cost-of-ownership of the processes performed in the thermal processing chamber. In some configurations, the cover includes two or more ports that are formed therein and are positioned to deliver a gas, from a space formed between the reflector plate and the cover, to desired regions of the substrate during processing to reduce the temperature variation across the substrate.
Public/Granted literature
- US20150155190A1 APPARATUS FOR REDUCING THE EFFECT OF CONTAMINATION ON A RAPID THERMAL PROCESS Public/Granted day:2015-06-04
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