Invention Grant
- Patent Title: Phase analyzer, phase analysis method, and surface analyzer
- Patent Title (中): 相位分析仪,相位分析法和表面分析仪
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Application No.: US14716984Application Date: 2015-05-20
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Publication No.: US09518942B2Publication Date: 2016-12-13
- Inventor: Naoki Kato , Masaru Takakura , Norihisa Mori , Shinya Fujita , Shigeru Honda
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2014-105393 20140521
- Main IPC: G01N23/222
- IPC: G01N23/222 ; G01N23/225 ; H01J37/244

Abstract:
A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.
Public/Granted literature
- US20150362446A1 Phase Analyzer, Phase Analysis Method, and Surface Analyzer Public/Granted day:2015-12-17
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