Invention Grant
- Patent Title: Methods of detecting inhomogeneity of a layer and apparatus for performing the same
- Patent Title (中): 检测层的不均匀性的方法及其执行方法
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Application No.: US14197737Application Date: 2014-03-05
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Publication No.: US09528949B2Publication Date: 2016-12-27
- Inventor: Jung-Hoon Kim , Jin-A Ryu , Chang-Ho Lee , Dong-Won Kim , Jae-Ho Kim , Jung-Dae Park , Nae-Ry Yu , Pil-Kwon Jun
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel, P.A.
- Priority: KR10-2013-0026683 20130313
- Main IPC: G01N23/20
- IPC: G01N23/20

Abstract:
In a method of detecting inhomogeneity of a layer, an incident light may be irradiated to at least two regions of the layer at a first incident angle position. First reflected lights reflected from the two regions of the layer may be sensed. The incident light may be irradiated to the at least two regions of the layer at a second incident angle position. Second reflected lights reflected from the two regions of the layer may be sensed. The first reflected lights and the second reflected lights may be compared with each other to obtain the inhomogeneity of the layer. Thus, the layer having a spot may be found.
Public/Granted literature
- US20140270078A1 Methods of Detecting Inhomogeneity of a Layer and Apparatus for Performing the Same Public/Granted day:2014-09-18
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