Invention Grant
- Patent Title: Memory cell coupling compensation
- Patent Title (中): 存储单元耦合补偿
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Application No.: US15059367Application Date: 2016-03-03
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Publication No.: US09552257B2Publication Date: 2017-01-24
- Inventor: Zhenlei Shen , William H. Radke , Peter Feeley
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G06F11/10 ; G11C29/04 ; G11C16/10 ; G11C16/26 ; G11C29/52 ; G11C16/04 ; G11C16/06

Abstract:
Methods for memory cell coupling compensation and apparatuses configured to perform the same are described. One or more methods for memory cell coupling compensation includes determining a state of a memory cell using a voltage that is changed in accordance with a first memory cell coupling compensation voltage, performing an error check on the state of the memory cell, and determining the state of the memory cell using a voltage that is changed in accordance with a second memory cell coupling compensation voltage in response to the error check failing.
Public/Granted literature
- US20160203048A1 MEMORY CELL COUPLING COMPENSATION Public/Granted day:2016-07-14
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