Invention Grant
- Patent Title: Plasma cleaning apparatus and method
- Patent Title (中): 等离子体清洗装置及方法
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Application No.: US14277010Application Date: 2014-05-13
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Publication No.: US09552968B2Publication Date: 2017-01-24
- Inventor: Martin Deehan , Matt Cheng-Hsiung Tsai , Nan Lu , David T. Or , Mei Chang
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: B08B7/04
- IPC: B08B7/04 ; H01J37/32 ; B08B7/00 ; H01L21/67

Abstract:
Embodiments of the present invention generally include an apparatus for plasma cleaning and a method for plasma cleaning. The apparatus can include a lid body having a first surface for facing a pedestal during cleaning and a second surface opposite the first surface and substantially parallel to the first surface, the second surface having a first indentation sized to receive a magnet assembly, one or more handles coupled to the second surface of the lid body, and the magnet assembly resting in the first indentation. The method can include removing a sputtering target from the processing chamber, sealing the processing chamber, introducing a gas into the processing chamber, applying an RF bias to a pedestal within the processing chamber, maintaining the pedestal at a substantially constant temperature, and removing material from the pedestal to clean the pedestal.
Public/Granted literature
- US20140283872A1 PLASMA CLEANING APPARATUS AND METHOD Public/Granted day:2014-09-25
Information query
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