Invention Grant
US09557652B2 Use of compositions comprising a surfactant and a hydrophobizer for avoiding anti pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below 有权
使用包含表面活性剂和疏水化剂的组合物,用于在线空间尺寸为50nm或以下时处理图案化材料时避免抗图案塌陷

  • Patent Title: Use of compositions comprising a surfactant and a hydrophobizer for avoiding anti pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below
  • Patent Title (中): 使用包含表面活性剂和疏水化剂的组合物,用于在线空间尺寸为50nm或以下时处理图案化材料时避免抗图案塌陷
  • Application No.: US14652120
    Application Date: 2013-12-04
  • Publication No.: US09557652B2
    Publication Date: 2017-01-31
  • Inventor: Andreas KlippAndrei HonciucGünter OetterChristian Bittner
  • Applicant: BASF SE
  • Applicant Address: DE Ludwigshafen
  • Assignee: BASF SE
  • Current Assignee: BASF SE
  • Current Assignee Address: DE Ludwigshafen
  • Agency: Armstrong Teasdale LLP
  • International Application: PCT/IB2013/060616 WO 20131204
  • International Announcement: WO2014/091363 WO 20140619
  • Main IPC: G03F7/42
  • IPC: G03F7/42 H01L21/02 H01L21/027 C11D1/835 C11D1/94 C11D11/00 G03F7/20 G03F7/40
Use of compositions comprising a surfactant and a hydrophobizer for avoiding anti pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below
Abstract:
In a method of treating a substrate including patterns having line-space dimensions of 50 nm or below, the substrate is rinsed by an aqueous composition including at least one non-ionic surfactant A and at least one hydrophobizer B. The at least one surfactant A has an equilibrium surface tension of 10 mN/m to 35 mN/m, determined from a solution of the at least one surfactant A in water at the critical micelle concentration. The hydrophobizer B is selected so that the contact angle of water to the substrate is increased by contacting the substrate with a solution of the hydrophobizer B in water by 5-95° compared to the contact angle of water to the substrate before such contacting.
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