Invention Grant
US09558145B2 Method, apparatus and system for measuring latency in a physical unit of a circuit
有权
用于测量电路物理单元中的延迟的方法,装置和系统
- Patent Title: Method, apparatus and system for measuring latency in a physical unit of a circuit
- Patent Title (中): 用于测量电路物理单元中的延迟的方法,装置和系统
-
Application No.: US14991293Application Date: 2016-01-08
-
Publication No.: US09558145B2Publication Date: 2017-01-31
- Inventor: David J. Harriman , Mahesh Wagh , Abdul R. Ismail , Daniel S. Froelich
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: H04B17/00
- IPC: H04B17/00 ; G06F13/42 ; G06F13/00 ; G06F13/38 ; G06F1/14

Abstract:
In an embodiment, an apparatus includes a counter to count between a start value and an end value according to a local clock signal, a first register to store an output of the counter, a mirror elastic buffer to store samples of the counter output received from the first register, where the mirror elastic buffer is to mirror an elastic buffer of a receiver circuit, and a resolution logic to receive a counter output sample from the mirror elastic buffer and a current counter value output from the counter, and to determine a transit latency for a data element to traverse the receiver circuit based at least in part on the counter output sample and the current counter value. Other embodiments are described and claimed.
Public/Granted literature
- US20160124894A1 METHOD, APPARATUS AND SYSTEM FOR MEASURING LATENCY IN A PHYSICAL UNIT OF A CIRCUIT Public/Granted day:2016-05-05
Information query