Invention Grant
- Patent Title: Memory including blocking dielectric in etch stop tier
- Patent Title (中): 存储器包括蚀刻停止层中的阻挡电介质
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Application No.: US14746515Application Date: 2015-06-22
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Publication No.: US09559109B2Publication Date: 2017-01-31
- Inventor: Fatma Arzum Simsek-Ege , John Hopkins , Srikant Jayanti
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H01L29/792
- IPC: H01L29/792 ; H01L27/115 ; H01L29/66 ; H01L29/788

Abstract:
Vertical memories and methods of making the same are discussed generally herein. In one embodiment, a vertical memory can include a vertical pillar extending to a source, an etch stop tier over the source, and a stack of alternating dielectric tiers and conductive tiers over the etch stop tier. The etch stop tier can comprise a blocking dielectric adjacent to the pillar. In another embodiment, the etch stop tier can comprise a blocking dielectric adjacent to the pillar, and a plurality of dielectric films horizontally extending from the blocking dielectric into the etch stop tier.
Public/Granted literature
- US20150287734A1 MEMORY INCLUDING BLOCKING DIELECTRIC IN ETCH STOP TIER Public/Granted day:2015-10-08
Information query
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