发明授权
- 专利标题: Resistive memory device and method of operating the same
- 专利标题(中): 电阻式存储器件及其操作方法
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申请号: US14839606申请日: 2015-08-28
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公开(公告)号: US09570170B2公开(公告)日: 2017-02-14
- 发明人: Chi-Weon Yoon , Hyun-Kook Park , Yeong-Taek Lee , Bo-Geun Kim , Yong-Kyu Lee
- 申请人: Chi-Weon Yoon , Hyun-Kook Park , Yeong-Taek Lee , Bo-Geun Kim , Yong-Kyu Lee
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Volentine & Whitt, PLLC
- 优先权: KR10-2014-0166627 20141126
- 主分类号: G11C8/00
- IPC分类号: G11C8/00 ; G11C13/00 ; G11C11/56 ; G11C11/16
摘要:
A memory device includes a memory cell array having multiple memory cells arranged respectively in regions where first signal lines cross second signal lines. The memory device further includes a decoder having multiple line selection switch units connected respectively to the of first signal lines. Each of the multiple line selection switch units applies a bias voltage to a first signal line corresponding to each of the multiple line selection switch units in response selectively to a first switching signal and a second switching signal, voltage levels of which are different from each other in activated states.
公开/授权文献
- US20160148683A1 RESISTIVE MEMORY DEVICE AND METHOD OF OPERATING THE SAME 公开/授权日:2016-05-26
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