Invention Grant
- Patent Title: Apparatuses, sense circuits, and methods for compensating for a wordline voltage increase
- Patent Title (中): 用于补偿字线电压增加的装置,检测电路和方法
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Application No.: US15152449Application Date: 2016-05-11
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Publication No.: US09576654B2Publication Date: 2017-02-21
- Inventor: Daniele Vimercati , Riccardo Muzzetto
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C13/00 ; G11C7/12 ; G11C8/08 ; G11C7/14 ; G11C7/06 ; G11C29/02 ; G11C29/04 ; G11C29/12

Abstract:
Apparatuses, sense circuits, and methods for compensating for a voltage increase on a wordline in a memory is described. An example apparatus includes a bitline, a memory cell coupled to the bitline, a bipolar selector device coupled to the memory cell, a wordline coupled to the bipolar selector device, and a wordline driver coupled to the wordline. The apparatus further includes a model wordline circuit configured to model an impedance of the wordline and an impedance of the wordline driver, and a sense circuit coupled to the bitline and to the model wordline circuit. The sense circuit is configured to sense a state of the memory cell based on a cell current and provide a sense signal indicating a state of the memory cell. The sense circuit is further configured to adjust a bitline voltage responsive to an increase in wordline voltage as modeled by the model wordline circuit.
Public/Granted literature
- US20160254049A1 APPARATUSES, SENSE CIRCUITS, AND METHODS FOR COMPENSATING FOR A WORDLINE VOLTAGE INCREASE Public/Granted day:2016-09-01
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