Invention Grant
US09576656B2 Device and method for setting resistive random access memory cell
有权
用于设置电阻随机存取存储单元的装置和方法
- Patent Title: Device and method for setting resistive random access memory cell
- Patent Title (中): 用于设置电阻随机存取存储单元的装置和方法
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Application No.: US14061092Application Date: 2013-10-23
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Publication No.: US09576656B2Publication Date: 2017-02-21
- Inventor: Chun-Yang Tsai , Yu-Wei Ting , Kuo-Ching Huang
- Applicant: Taiwan Semiconductor Manufacturing Company Limited
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee Address: TW Hsinchu
- Agency: Jones Day
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
A device and method for setting a resistive random access memory cell are provided. An exemplary method includes: providing a set current to a bit line of the RRAM cell by a current source. An exemplary device includes: a first RRAM cell and a current source. The first RRAM cell is connected to a first word line. The current source selectively connected to the first bit line. The current source selectively provides a current to the first bit line of the first RRAM cell to set the first RRAM cell.
Public/Granted literature
- US20150109849A1 DEVICE AND METHOD FOR SETTING RESISTIVE RANDOM ACCESS MEMORY CELL Public/Granted day:2015-04-23
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