Invention Grant
US09594615B2 Estimating flash quality using selective error emphasis 有权
使用选择性错误强调估算闪光质量

Estimating flash quality using selective error emphasis
Abstract:
A method for data storage includes reading from a memory device data that is stored in a group of memory cells as respective analog values, and classifying readout errors in the read data into at least first and second different types, depending on zones in which the analog values fall. A memory quality that emphasizes the readout errors of the second type is assigned to the group of the memory cells, based on evaluated numbers of the readout errors of the first and second types.
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