Invention Grant
- Patent Title: Handler apparatus that conveys a device under test to a test socket and test apparatus that comprises the handler apparatus
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Application No.: US14472394Application Date: 2014-08-29
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Publication No.: US09606170B2Publication Date: 2017-03-28
- Inventor: Tsuyoshi Yamashita , Mitsunori Aizawa , Hiromitsu Horino , Yuya Yamada , Masataka Onozawa
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Gunma
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Gunma
- Priority: KR10-2014-0034353 20140325
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01C11/00 ; G01R1/04

Abstract:
Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.
Public/Granted literature
- US20150276863A1 Handler Apparatus and Test Apparatus Public/Granted day:2015-10-01
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