公开(公告)号：US09784789B2

公开(公告)日：2017-10-10

申请号：US14472392

申请日：2014-08-29

Applicant: ADVANTEST CORPORATION

Inventor： Aritomo Kikuchi ,  Tsuyoshi Yamashita ,  Mitsunori Aizawa ,  Hiromitsu Horino ,  Yuya Yamada ,  Masataka Onozawa

IPC: G01R31/28 ,  G01R1/04 ,  G01C11/00

CPC classification number: G01R31/2891 ,  G01C11/00 ,  G01R1/0441 ,  G01R31/2893

Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.

公开(公告)号：US11714124B2

公开(公告)日：2023-08-01

申请号：US17358414

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Hiromitsu Horino ,  Yoshitaka Takeuchi ,  Yoshinori Arai ,  Hiroyuki Kikuchi

IPC: G01R31/28

CPC classification number: G01R31/2893 ,  G01R31/2887

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.

公开(公告)号：US09606170B2

公开(公告)日：2017-03-28

申请号：US14472394

申请日：2014-08-29

Applicant: ADVANTEST CORPORATION

Inventor： Tsuyoshi Yamashita ,  Mitsunori Aizawa ,  Hiromitsu Horino ,  Yuya Yamada ,  Masataka Onozawa

IPC: G01R31/28 ,  G01C11/00 ,  G01R1/04

CPC classification number: G01R31/2891 ,  G01C11/00 ,  G01R1/0441 ,  G01R31/2893

Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.

公开(公告)号：US20220026486A1

公开(公告)日：2022-01-27

申请号：US17358414

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Hiromitsu Horino ,  Yoshitaka Takeuchi ,  Yoshinori Arai ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.

公开(公告)号：US09658287B2

公开(公告)日：2017-05-23

申请号：US14472388

申请日：2014-08-29

Applicant: ADVANTEST CORPORATION

Inventor： Tsuyoshi Yamashita ,  Mitsunori Aizawa ,  Hiromitsu Horino ,  Yuya Yamada ,  Masataka Onozawa

IPC: G01R31/20 ,  G01R31/28 ,  G01C11/00 ,  G01R1/04

CPC classification number: G01R31/2891 ,  G01C11/00 ,  G01R1/0441 ,  G01R31/2893

Abstract: A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.

公开(公告)号：US09316686B2

公开(公告)日：2016-04-19

申请号：US13671568

申请日：2012-11-08

Applicant: ADVANTEST CORPORATION

Inventor： Hiromitsu Horino ,  Masataka Onozawa

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R31/2891 ,  G01R31/2867 ,  G01R31/2874 ,  G01R31/2893

Abstract: A handler for conveying a plurality of devices under test to a socket for a test that can reduce a test time includes: a test section provided with the socket; a heat applying section into which a tray having a plurality of devices under test placed on its surface is conveyed and that controls the temperature of the devices under test to a predetermined test temperature and conveys the tray into the test section; a device image capturing section that in the heat applying section, captures images of the respective devices under test by moving with respect to the surface of the tray in two non-parallel directions of a first direction and a second direction; and a position adjusting section that adjusts the positions of the devices under test with respect to the socket based on the images of the devices under test captured by the device image capturing section.

Abstract translation: 用于将多个待测设备传送到插座以用于可以减少测试时间的测试的处理器包括：设置有插座的测试部分; 输送具有被测试的多个被测设备的托盘在其表面上的热施加部分，并将被测设备的温度控制在预定的测试温度并将托盘传送到测试部分中; 一种装置图像拍摄部，其在所述加热部中，通过相对于所述托盘的表面在第一方向和第二方向的两个非平行方向上移动来捕获被测试的各个装置的图像; 以及位置调整部，其基于由所述装置图像拍摄部拍摄的被测设备的图像，调整被测设备相对于所述插座的位置。

公开(公告)号：US09024648B2

公开(公告)日：2015-05-05

申请号：US13669464

申请日：2012-11-06

Applicant: Advantest Corporation

Inventor： Hiromitsu Horino ,  Masataka Onozawa

IPC: G01R31/00 ,  G01R31/20 ,  G01R1/02 ,  G01R31/01 ,  G01R31/28

CPC classification number: G01R1/02 ,  G01R31/01 ,  G01R31/2867 ,  G01R31/2874 ,  G01R31/2891 ,  G01R31/2893

Abstract: A handler for conveying DUTs to a socket for a test that can reduce a test time includes: a test section including the socket; a heat applying section into which a tray having plural DUTs placed on its surface is conveyed and that controls the temperature of the DUTs to a predetermined test temperature and conveys the tray into the test section; and a device image capturing section that includes imaging elements arranged along a first direction the number of which is equal to DUTs arranged along the first direction and that in the heat applying section, captures images of the DUTs by moving the imaging elements relative to the surface of the tray in a second direction non-parallel with the first direction; and a position adjusting section that adjusts the positions of the DUTs relative to the socket based on their images captured by the device image capturing section.

Abstract translation: 用于将DUT传送到插座以用于可以减少测试时间的测试的处理器包括：包括插座的测试部分; 传送具有放置在其表面上的多个DUT的托盘的热施加部，并且将DUT的温度控制到预定的测试温度并将托盘输送到测试部分中; 以及装置图像拍摄部，其包括沿着第一方向布置的成像元件，所述成像元件的数量等于沿着所述第一方向布置的DUT，并且所述加热部中的成像元件通过相对于所述表面移动所述成像元件来捕获所述DUT的图像 的托盘在与第一方向不平行的第二方向上; 以及位置调整部，其基于由所述装置图像拍摄部拍摄的图像来调整所述DUT相对于所述插座的位置。