Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US14413447Application Date: 2013-07-08
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Publication No.: US09638640B2Publication Date: 2017-05-02
- Inventor: Masahiko Iijima , Akihisa Makino , Manabu Ando
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-163213 20120724
- International Application: PCT/JP2013/068584 WO 20130708
- International Announcement: WO2014/017277 WO 20140130
- Main IPC: G01N21/75
- IPC: G01N21/75 ; G01N1/38 ; G01N21/47 ; G01N35/00 ; G01N21/59 ; G01N35/04

Abstract:
An automatic analyzer which can reduce the effort necessary for conducting a test of limit of detection/limit of quantification properties and managing the test results is provided. Operation condition-setting means for conducting an evaluation test for at least one of a limit of detection and a limit of quantification for each measurement item, determination condition-setting means for setting a determination condition of the evaluation test, and a calculation unit for obtaining a measurement result of a dilution series containing different dilution concentrations by controlling the sample-dispensing mechanism, the reagent-dispensing mechanism and the measurement unit based on the set operation condition, and calculating a test result of the evaluation test from the measurement result of the dilution series based on the set determination condition are disposed.
Public/Granted literature
- US20150204794A1 AUTOMATIC ANALYER Public/Granted day:2015-07-23
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