Invention Grant
- Patent Title: Built in test circuit for transient voltage suppressor devices
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Application No.: US14503937Application Date: 2014-10-01
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Publication No.: US09671453B2Publication Date: 2017-06-06
- Inventor: James Quigley , Gary L. Hess
- Applicant: HAMILTON SUNDSTRAND CORPORATION
- Applicant Address: US NC Charlotte
- Assignee: Hamilton Sundstrand Corporation
- Current Assignee: Hamilton Sundstrand Corporation
- Current Assignee Address: US NC Charlotte
- Agency: Kinney & Lange, P.A.
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; G01R19/00 ; H02H9/04
Abstract:
A built-in test system includes a control circuit, a transient voltage suppressor circuit, and a test switch. The control circuit is configured to receive a signal, and the transient voltage suppressor circuit includes first and second transient voltage suppressors connected in series between the signal and ground. The test switch is connected to selectively conduct current between the signal and a node between the first and second transient voltage suppressors. The control circuit is configured to control the test switch to test the first and second transient voltage suppressors.
Public/Granted literature
- US20160097803A1 BUILT IN TEST CIRCUIT FOR TRANSIENT VOLTAGE SUPPRESSOR DEVICES Public/Granted day:2016-04-07
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