公开(公告)号：US20160097803A1

公开(公告)日：2016-04-07

申请号：US14503937

申请日：2014-10-01

Applicant: Hamilton Sundstrand Corporation

Inventor： James Quigley ,  Gary L. Hess

IPC: G01R31/28 ,  G01R19/00

CPC classification number: G01R31/2827 ,  G01R19/0084 ,  H02H9/041 ,  H02H9/042

Abstract: A built-in test system includes a control circuit, a transient voltage suppressor circuit, and a test switch. The control circuit is configured to receive a signal, and the transient voltage suppressor circuit includes first and second transient voltage suppressors connected in series between the signal and ground. The test switch is connected to selectively conduct current between the signal and a node between the first and second transient voltage suppressors. The control circuit is configured to control the test switch to test the first and second transient voltage suppressors.

Abstract translation: 内置测试系统包括控制电路，瞬态电压抑制电路和测试开关。 控制电路被配置为接收信号，并且瞬态电压抑制电路包括串联连接在信号与地之间的第一和第二瞬态电压抑制器。 连接测试开关以选择性地在第一和第二瞬态电压抑制器之间的信号与节点之间传导电流。 控制电路被配置为控制测试开关来测试第一和第二瞬态电压抑制器。

公开(公告)号：US09671453B2

公开(公告)日：2017-06-06

申请号：US14503937

申请日：2014-10-01

Applicant: HAMILTON SUNDSTRAND CORPORATION

Inventor： James Quigley ,  Gary L. Hess

IPC: G01R31/00 ,  G01R31/28 ,  G01R19/00 ,  H02H9/04

CPC classification number: G01R31/2827 ,  G01R19/0084 ,  H02H9/041 ,  H02H9/042

Abstract: A built-in test system includes a control circuit, a transient voltage suppressor circuit, and a test switch. The control circuit is configured to receive a signal, and the transient voltage suppressor circuit includes first and second transient voltage suppressors connected in series between the signal and ground. The test switch is connected to selectively conduct current between the signal and a node between the first and second transient voltage suppressors. The control circuit is configured to control the test switch to test the first and second transient voltage suppressors.