Invention Grant
- Patent Title: Semiconductor device for performing test and repair operations
-
Application No.: US14253971Application Date: 2014-04-16
-
Publication No.: US09690723B2Publication Date: 2017-06-27
- Inventor: Hyung-Gyun Yang , Hyung-Dong Lee , Yong-Kee Kwon , Young-Suk Moon , Hong-Sik Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2013-0043884 20130422
- Main IPC: G06F13/16
- IPC: G06F13/16 ; G06F13/30
Abstract:
A semiconductor device may include: a storage unit configured to store program codes provided through control of a processor core; and a control unit configured to perform a control operation on a semiconductor memory device according to the program codes.
Public/Granted literature
- US20140317332A1 SEMICONDUCTOR DEVICE FOR PERFORMING TEST AND REPAIR OPERATIONS Public/Granted day:2014-10-23
Information query
