Invention Grant
- Patent Title: Method of inspecting a surface of an object and optical system for performing the same
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Application No.: US14751477Application Date: 2015-06-26
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Publication No.: US09702826B2Publication Date: 2017-07-11
- Inventor: Kohei Hashimoto , Wook-Rae Kim , Byeong-Hwan Jeon , Chang-Hoon Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2014-0120477 20140911
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88 ; G01N21/95 ; G01N21/958

Abstract:
A method of inspecting a surface of an object includes providing a laser beam irradiated in a first direction substantially parallel to the surface of the object, adjusting a diameter of the annular laser beam, reflecting the annular laser beam toward the surface of the object in a second direction substantially perpendicular to the first direction, in a primary reflection, and reflecting the primarily reflected laser toward an inspection region of the object, in a secondary reflection. An incident angle of the annular laser beam with respect to the surface of the object may be determined by the diameter of the annular laser beam.
Public/Granted literature
- US20160077017A1 METHOD OF INSPECTING A SURFACE OF AN OBJECT AND OPTICAL SYSTEM FOR PERFORMING THE SAME Public/Granted day:2016-03-17
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