Invention Grant
- Patent Title: Trace gas concentration in ART MS traps
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Application No.: US14384782Application Date: 2013-03-13
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Publication No.: US09714919B2Publication Date: 2017-07-25
- Inventor: Gerardo A. Brucker , Timothy C. Swinney , G. Jeffery Rathbone
- Applicant: MKS Instruments, Inc.
- Applicant Address: US MA Andover
- Assignee: MKS Instruments, Inc.
- Current Assignee: MKS Instruments, Inc.
- Current Assignee Address: US MA Andover
- Agency: Hamilton, Brook, Smith & Reynolds, P.C.
- International Application: PCT/US2013/030801 WO 20130313
- International Announcement: WO2013/138446 WO 20130919
- Main IPC: G01N27/64
- IPC: G01N27/64 ; G01N27/60 ; H01J49/06 ; H01J49/42 ; G01N1/40 ; H01J49/16

Abstract:
A method of detecting specific gas species in an ion trap, the specific gas species initially being a trace component of a first low concentration in the volume of gas, includes ionizing the gas including the specific gas species, thereby creating specific ion species. The method further includes producing an electrostatic potential in which the specific ion species are confined in the ion trap to trajectories. The method also includes exciting confined specific ion species with an AC excitation source having an excitation frequency, scanning the excitation frequency of the AC excitation source to eject the specific ion species from the ion trap, and detecting the ejected specific ion species. The method further includes increasing the concentration of the specific ion species within the ion trap relative to the first low concentration prior to scanning the excitation frequency that ejects the ions of the specific gas species.
Public/Granted literature
- US20150028882A1 Trace Gas Concentration in ART MS Traps Public/Granted day:2015-01-29
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