- 专利标题: Method of measuring a change in an optical path length using differential laser self-mixing interferometry and a differential laser self-mixing interferometry measuring system
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申请号: US15104952申请日: 2014-10-15
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公开(公告)号: US09726474B2公开(公告)日: 2017-08-08
- 发明人: Santiago Royo Royo , Francisco Javier Azcona Guerro , Ajit Jha
- 申请人: UNIVERSITAT POLITÈCNICA DE CATALUNYA
- 申请人地址: ES Barcelona
- 专利权人: UNIVERSITAT POLITECNICA DE CATALUNYA
- 当前专利权人: UNIVERSITAT POLITECNICA DE CATALUNYA
- 当前专利权人地址: ES Barcelona
- 代理机构: Hess Patent Law Firm
- 代理商 Robert J. Hess
- 优先权: ES13005853 20131217
- 国际申请: PCT/IB2014/002119 WO 20141015
- 国际公布: WO2015/092498 WO 20150625
- 主分类号: G01B9/02
- IPC分类号: G01B9/02 ; G01S17/32 ; G01S17/58 ; G01B11/02 ; G01S7/491
摘要:
A method and system to implement the method of measuring a change in an optical path length using differential laser self-mixing interferometry. The method includes obtaining a reference SMI signal (Sr) and a main measurement SMI signal (Sm) of a laser (LD) and determining the relative change in the optical path length between the (LD) and a target (T) in a range between 0 and λ/2, by comparing the relative positions along time of fringes or transitions of the (Sm) and (Sr). The (Sr) and the (Sm) are obtained at different moments once backscattered laser light (br) is generated from the reflection on said target (T) of a reference and a main measurement laser light beam emitted by the laser (LD) and while being modulated according to a specific modulation pattern that maintained while both the (Sr) and the (Sm) are acquired and has re-entered its laser cavity.
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