摘要:
A system and method for scanning a surface and a computer program implementing the method. The method is suitable for performing the functions carried out by the system of the invention. The computer program implements the method of the invention. The system means for illuminating illuminates different sub-areas (Si) of a surface (S) with a light beam (Be) in an alternating manner, and receives and detects the portions of reflected light (Br) reflected on same, including: one or more light detectors (D); and light redirection means including a determined spatial distribution model (Qr) of the light redirection elements (GM), which receive the portions of reflected light (Br) and sequentially redirect them towards the light detector or detectors (D).
摘要:
A method and system to implement the method of measuring a change in an optical path length using differential laser self-mixing interferometry. The method includes obtaining a reference SMI signal (Sr) and a main measurement SMI signal (Sm) of a laser (LD) and determining the relative change in the optical path length between the (LD) and a target (T) in a range between 0 and λ/2, by comparing the relative positions along time of fringes or transitions of the (Sm) and (Sr). The (Sr) and the (Sm) are obtained at different moments once backscattered laser light (br) is generated from the reflection on said target (T) of a reference and a main measurement laser light beam emitted by the laser (LD) and while being modulated according to a specific modulation pattern that maintained while both the (Sr) and the (Sm) are acquired and has re-entered its laser cavity.
摘要:
A method and system to implement the method of measuring a change in an optical path length using differential laser self-mixing interferometry. The method includes obtaining a reference SMI signal (Sr) and a main measurement SMI signal (Sm) of a laser (LD) and determining the relative change in the optical path length between the (LD) and a target (T) in a range between 0 and λ/2, by comparing the relative positions along time of fringes or transitions of the (Sm) and (Sr). The (Sr) and the (Sm) are obtained at different moments once backscattered laser light (br) is generated from the reflection on said target (T) of a reference and a main measurement laser light beam emitted by the laser (LD) and while being modulated according to a specific modulation pattern that maintained while both the (Sr) and the (Sm) are acquired and has re-entered its laser cavity.