Invention Grant
- Patent Title: Method and apparatus for supplying ion beam in ion implantation process
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Application No.: US15342582Application Date: 2016-11-03
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Publication No.: US09741537B1Publication Date: 2017-08-22
- Inventor: Tai-Kun Kao , Tsung-Min Lin , Jen-Chung Chiu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01J37/08
- IPC: H01J37/08 ; H01J37/30 ; H01J37/317 ; H01L21/265

Abstract:
A method for generating an ion beam in an ion implantation process is provided. The method includes supplying a working gas into a first portion of an arc chamber which is separated from a second portion of the arc chamber by an intermediate plate. The method further includes guiding the working gas into the second portion of the arc chamber via a plurality of gas outlets formed at two opposite edges of the intermediate plate. The method also includes generating an ion beam from the working gas in the second portion of the arc chamber.
Public/Granted literature
- US20170243719A1 METHOD AND APPARATUS FOR SUPPLYING ION BEAM IN ION IMPLANTATION PROCESS Public/Granted day:2017-08-24
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