Invention Grant
- Patent Title: Method for calibrating a laser deflection apparatus of a laser microdissection system and laser microdissection system
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Application No.: US14913385Application Date: 2014-08-22
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Publication No.: US09759551B2Publication Date: 2017-09-12
- Inventor: Falk Schlaudraff , Qing Tang
- Applicant: LEICA MICROSYSTEMS CMS GMBH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voti & Mayer, Ltd.
- Priority: DE102013216938 20130826
- International Application: PCT/EP2014/067896 WO 20140822
- International Announcement: WO2015/028401 WO 20150305
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G02B21/32 ; G01N33/483 ; G06T7/00 ; G01N1/28

Abstract:
A method for calibrating a laser deflection device in a reflected light device of a microscope of a laser microdissection system having a digital image capturing unit comprising an image evaluation module includes generating a laser beam; guiding the laser beam through a microscope objective; directing the laser beam to a position defined by actuation signals; placing a calibration object in the object plane of the microscope objective; actuating the laser deflection device using first actuation signals and first calibration values, making at least one calibration mark on the calibration object; capturing an image of the calibration object by the digital image capturing unit; determining actual position values for the at least one calibration mark: and determining second calibration values based on a relationship between the default position values and the actual position values.
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