公开(公告)号：US09759551B2

公开(公告)日：2017-09-12

申请号：US14913385

申请日：2014-08-22

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Falk Schlaudraff ,  Qing Tang

IPC: G01B11/14 ,  G02B21/32 ,  G01N33/483 ,  G06T7/00 ,  G01N1/28

CPC classification number: G01B11/14 ,  G01N33/4833 ,  G01N2001/282 ,  G01N2001/2886 ,  G02B21/32 ,  G06T7/0012 ,  G06T2207/10056 ,  G06T2207/30204

Abstract: A method for calibrating a laser deflection device in a reflected light device of a microscope of a laser microdissection system having a digital image capturing unit comprising an image evaluation module includes generating a laser beam; guiding the laser beam through a microscope objective; directing the laser beam to a position defined by actuation signals; placing a calibration object in the object plane of the microscope objective; actuating the laser deflection device using first actuation signals and first calibration values, making at least one calibration mark on the calibration object; capturing an image of the calibration object by the digital image capturing unit; determining actual position values for the at least one calibration mark: and determining second calibration values based on a relationship between the default position values and the actual position values.