Invention Grant
- Patent Title: Memory repair redundancy with array cache redundancy
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Application No.: US14572166Application Date: 2014-12-16
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Publication No.: US09773571B2Publication Date: 2017-09-26
- Inventor: Chi Lo , Shuo-Nan Hung , Chun-Hsiung Hung
- Applicant: Macronix International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes Beffel & Wolfeld LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/00

Abstract:
An integrated circuit including a memory, an array cache, and a cache replacement store is described. The memory includes a primary array and a redundant array. The integrated circuit also includes circuitry configured to transfer data into or out of the primary array using the array cache. For defective locations in the array cache, the circuitry is configured to use the cache replacement store in the transfer of data in place of the defective locations in the array cache, and map addresses in the primary array corresponding to the defective locations in the cache array to the redundant array.
Public/Granted literature
- US20160170853A1 MEMORY REPAIR REDUNDANCY Public/Granted day:2016-06-16
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