Invention Grant
- Patent Title: Devices and methods of measuring gain of a voltage-controlled oscillator
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Application No.: US14287569Application Date: 2014-05-27
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Publication No.: US09784770B2Publication Date: 2017-10-10
- Inventor: Shih-An Yu , Yu-Hong Lin , Sen-You Liu , Fang-Ren Liao
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schiff Hardin LLP
- Main IPC: H03L7/18
- IPC: H03L7/18 ; G01R19/10 ; G01R23/02 ; G01R27/28 ; H03L7/099 ; G01R19/00 ; H03L7/183

Abstract:
A voltage-controlled oscillator gain measurement system includes a voltage-controlled oscillator, a voltage detector, and a processor. The voltage-controlled oscillator, which is configured in a phase-locked loop circuit, generates an output signal with an output frequency according to a control signal. The control signal is generated according to the output signal divided by a scaling number. The voltage detector is configured to measure a voltage difference of the control signal. The processor adjusts the scaling number to generate an output frequency difference of the output signal, and obtains a reciprocal gain of the voltage-controlled oscillator by dividing the voltage difference by the output frequency difference.
Public/Granted literature
- US20150346244A1 DEVICES AND METHODS OF MEASURING GAIN OF A VOLTAGE-CONTROLLED OSCILLATOR Public/Granted day:2015-12-03
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