- 专利标题: Loop parameter sensor using repetitive phase errors
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申请号: US14879933申请日: 2015-10-09
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公开(公告)号: US09800251B2公开(公告)日: 2017-10-24
- 发明人: Mark Ferriss , Arun S. Natarajan , Benjamin D. Parker , Alexander V. Rylyakov , Jose A. Tierno , Soner Yaldiz
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Scully, Scott, Murphy & Presser, P.C.
- 代理商 Vazken Alexanian
- 主分类号: H03L7/06
- IPC分类号: H03L7/06 ; H03L7/085 ; G01R31/28 ; H03L7/093 ; H03L7/107 ; H03L7/18
摘要:
A method and system are disclosed for measuring a specified parameter in a phase-locked loop frequency synthesizer (PLL). In one embodiment, the method comprises introducing multiple phase errors in the PLL, measuring a specified aspect of the introduced phase errors, and determining a value for the specified parameter using the measured aspects of the introduced phase errors. In one embodiment, the phase errors are introduced repetitively in the PLL, and these phase errors produce a modified phase difference between the reference signal and the feedback signal in the PPL. In one embodiment, crossover times, when this modified phase difference crosses over a preset value, are determined, and these crossover times are used to determine the value for the specified parameter. In an embodiment, the parameter is calculated as a mathematical function of the crossover times. The parameter may be, for example, the bandwidth of the PLL.
公开/授权文献
- US20160036452A1 LOOP PARAMETER SENSOR USING REPETITIVE PHASE ERRORS 公开/授权日:2016-02-04
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