Invention Grant
- Patent Title: Embedded die-down package-on-package device
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Application No.: US15273549Application Date: 2016-09-22
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Publication No.: US09812422B2Publication Date: 2017-11-07
- Inventor: Toong Erh Ooi , Bok Eng Cheah , Nitesh Nimkar
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe Williamson & Wyatt P.C.
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/00 ; H01L23/498 ; H01L25/10 ; H01L25/00 ; H01L23/538 ; H01L23/50 ; H01L21/48 ; H05K3/46 ; H05K1/18

Abstract:
An apparatus including a die; and a build-up carrier including alternating layers of conductive material and dielectric material disposed on a device side of the die and dielectric material embedding a portion of a thickness dimension of the die; and a plurality of carrier contact points disposed at a gradation between the device side of the die and the embedded thickness dimension of the die and configured for connecting the carrier to a substrate. A method including disposing a die on a sacrificial substrate with a device side of the die opposite the sacrificial substrate; forming a build-up carrier adjacent a device side of a die, wherein the build-up carrier includes a dielectric material defining a gradation between the device side of the die and a backside of the die, the gradation including a plurality of carrier contact points; and separating the die and the carrier from the sacrificial substrate.
Public/Granted literature
- US20170012020A1 EMBEDDED DIE-DOWN PACKAGE-ON-PACKAGE DEVICE Public/Granted day:2017-01-12
Information query
IPC分类: