Invention Grant
- Patent Title: Image sensor power supply noise detection
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Application No.: US14964159Application Date: 2015-12-09
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Publication No.: US09817048B2Publication Date: 2017-11-14
- Inventor: Yingkan Lin , Liang Zuo , Liping Deng
- Applicant: OMNIVISION TECHNOLOGIES, INC.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01R29/26
- IPC: G01R29/26

Abstract:
A power supply noise measurement circuit includes a multiphase filter coupled to receive a power supply signal. The multiphase filter is coupled to output a first filtered power supply signal for a first phase, and a second filtered power supply signal for a second phase. A multiphase amplifier is coupled to the multiphase filter to sample offset voltages in response to the first filter power supply signal during the first phase to set up DC operation points in the multiphase amplifier, and generate an amplified power supply noise signal during the second phase. An overshoot detector is coupled to the multiphase amplifier to detect overshoot events in the amplified power supply noise signal, and an undershoot detector is coupled to the multiphase amplifier to detect undershoot events in the amplified power supply noise signal.
Public/Granted literature
- US20170168104A1 IMAGE SENSOR POWER SUPPLY NOISE DETECTION Public/Granted day:2017-06-15
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