Invention Grant
- Patent Title: Self-aligned gate last III-N transistors
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Application No.: US15326022Application Date: 2014-08-13
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Publication No.: US09837499B2Publication Date: 2017-12-05
- Inventor: Han Wui Then , Sansaptak Dasgupta , Seung Hoon Sung , Sanaz Gardner , Marko Radosavlijevic , Robert Chau
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard & Mughal LLP
- International Application: PCT/US2014/050826 WO 20140813
- International Announcement: WO2016/024960 WO 20160218
- Main IPC: H01L29/15
- IPC: H01L29/15 ; H01L29/417 ; H01L29/20 ; H01L29/205 ; H01L29/778 ; H01L29/40 ; H01L29/66

Abstract:
Techniques related to III-N transistors having self aligned gates, systems incorporating such transistors, and methods for forming them are discussed. Such transistors include a polarization layer between a raised source and a raised drain, a gate between the source and drain and over the polarization layer, and lateral epitaxial overgrowths over the source and drain and having and opening therebetween such that at least a portion of the gate adjacent to the polarization layer is aligned with the opening.
Public/Granted literature
- US20170207310A1 SELF-ALIGNED GATE LAST III-N TRANSISTORS Public/Granted day:2017-07-20
Information query
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