Invention Grant
- Patent Title: Transmitter configured for test signal injection to test AC-coupled interconnect
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Application No.: US14717985Application Date: 2015-05-20
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Publication No.: US09841455B2Publication Date: 2017-12-12
- Inventor: Scott D. McLeod , Hsung Jai Im , Stanley Y. Chen
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: XILINX, INC.
- Current Assignee: XILINX, INC.
- Current Assignee Address: US CA San Jose
- Agent Robert M. Brush; Keith Taboada
- Main IPC: G01R31/04
- IPC: G01R31/04 ; H03K3/012 ; H03K3/3568 ; G01R31/28 ; G01R31/3185 ; H03K19/0175 ; H03K19/0185 ; H04L25/02

Abstract:
In one example, a driver circuit includes a differential transistor pair configured to be biased by a current source and including a differential input and a differential output. The driver circuit further includes a resistor pair coupled between a node pair and the differential output, a transistor pair coupled between a voltage supply and the node pair, and a bridge transistor coupled between the node pair. The driver circuit further includes a pair of three-state circuit elements having a respective pair of input ports, a respective pair of control ports, and a respective pair of output ports. The pair of output ports is respectively coupled to the node pair. The pair of control ports is coupled to a common node comprising each gate of the transistor pair and a gate of the bridge transistor.
Public/Granted literature
- US20160341780A1 TRANSMITTER CONFIGURED FOR TEST SIGNAL INJECTION TO TEST AC-COUPLED INTERCONNECT Public/Granted day:2016-11-24
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