- 专利标题： Distinguishing foreign surface features from native surface features
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申请号： US15166091申请日： 2016-05-26
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公开(公告)号： US09863892B2公开(公告)日： 2018-01-09
- 发明人: Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
- 申请人： Seagate Technology LLC
- 申请人地址： US CA Cupertino
- 专利权人： Seagate Technology LLC
- 当前专利权人： Seagate Technology LLC
- 当前专利权人地址： US CA Cupertino
- 主分类号： G01N21/00
- IPC分类号： G01N21/00 ; G01N21/94 ; G01N21/95 ; G01N21/956
摘要：
Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
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