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公开(公告)号：US11763845B2
公开(公告)日：2023-09-19
申请号：US17554341
申请日：2021-12-17
Applicant: Seagate Technology LLC
Inventor： Florin Zavaliche , Kai Chieh Chang , Pin-Wei Huang , Ganping Ju , Jan-Ulrich Thiele
CPC classification number: G11B5/716 , G11B5/657 , G11B5/7369 , G11B5/7379
Abstract: A magnetic stack includes a substrate and a soft magnetic underlayer deposited on a top surface of the substrate. A heat sink layer is disposed on top of the soft magnetic underlayer, and an interlayer is deposited on top of the heat sink layer. A non-magnetic seed layer is deposited on top of the interlayer. A magnetic recording structure which includes more than one magnetic recording layer is deposited on the top surface of the non-magnetic seed layer.
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公开(公告)号：US09784688B2
公开(公告)日：2017-10-10
申请号：US14046648
申请日：2013-10-04
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/8806 , G01N21/9501 , G01N2201/0636 , H04N7/18
Abstract: Provided herein is an apparatus, including a reflective surface configured to reflect photons onto a surface of an article, a stage configured to support the article, and an assembly. The assembly is configured to radiate photons through the article to the reflective surface. The assembly is further configured to image the article with irradiance of the photons.
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公开(公告)号：US09766179B2
公开(公告)日：2017-09-19
申请号：US15053946
申请日：2016-02-25
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , David M. Tung , Florin Zavaliche , Stephen Keith McLaurin
CPC classification number: G01N21/4738 , G01N21/95 , G01N2021/4764 , G01N2021/4792 , G01N2201/0635 , G01N2201/0683
Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
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公开(公告)号：US20170025139A1
公开(公告)日：2017-01-26
申请号：US15199668
申请日：2016-06-30
Applicant: Seagate Technology LLC
Inventor： Paul M. Jones , Timothy J. Klemmer , Ruoxi Yang , Martin Giles Blaber , Xiaoding Ma , ZhaoHui Z. Fan , Michael J. Stirniman , Yang Yang , XiaoPing Yan , Fujian Huang , Emil John C. Esmenda , Emir R. Kazazic , Florin Zavaliche , Hongbo Wang , Huan H. Tang , Kyoumarss Damavandi
IPC: G11B5/72
CPC classification number: G11B5/72 , G11B5/012 , G11B2005/0021
Abstract: Provided herein is an apparatus including a substrate and a magnetic recording layer over the substrate. In addition, a thermochromic layer is over the substrate, wherein the thermochromic layer includes a first optical absorbance at a first temperature and a second optical absorbance at a second temperature.
Abstract translation: 本文提供了一种装置，其包括在基板上的基板和磁记录层。 另外，热致变色层在衬底之上，其中热致变色层包括在第一温度下的第一光吸收和在第二温度下的第二光吸收。
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公开(公告)号：US20140098370A1
公开(公告)日：2014-04-10
申请号：US14046596
申请日：2013-10-04
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/55
CPC classification number: G01N21/55 , G01N21/4738 , G01N21/95
Abstract: Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article.
Abstract translation: 本文提供了一种装置，其包括被配置为从制品的周边缘将光子发射到制品中的第一光子发射器，以及被配置为检测从制品的特征散射的光子的光子检测器阵列。
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Patent Agency Ranking
公开(公告)号：US20230178106A1
公开(公告)日：2023-06-08
申请号：US17554341
申请日：2021-12-17
Applicant: Seagate Technology LLC
Inventor： Florin Zavaliche , Kai Chieh Chang , Pin-Wei Huang , Ganping Ju , Jan-Ulrich Thiele
Abstract: A magnetic stack includes a substrate and a soft magnetic underlayer deposited on a top surface of the substrate. A heat sink layer is disposed on top of the soft magnetic underlayer, and an interlayer is deposited on top of the heat sink layer. A non-magnetic seed layer is deposited on top of the interlayer. A magnetic recording structure which includes more than one magnetic recording layer is deposited on the top surface of the non-magnetic seed layer.
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公开(公告)号：US09863892B2
公开(公告)日：2018-01-09
申请号：US15166091
申请日：2016-05-26
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/00 , G01N21/94 , G01N21/95 , G01N21/956
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
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公开(公告)号：US09377394B2
公开(公告)日：2016-06-28
申请号：US14032186
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.
Abstract translation: 本文提供的装置包括光子检测器阵列; 以及处理装置，其被配置用于处理光子检测器阵列信号，所述光子检测器阵列信号对应于从聚焦在第一焦平面中的物体的表面特征散射的第一组光子和从聚焦在第二焦点的物体的表面特征散射的第二组光子散射的光子 焦平面，其中所述处理装置还被配置用于将所述制品的外来表面特征与所述制品的外来本机特征区分开。
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公开(公告)号：US20160169802A1
公开(公告)日：2016-06-16
申请号：US15047563
申请日：2016-02-18
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/6456 , G01N21/47 , G01N21/63 , G01N21/64 , G01N21/8851 , G01N21/94 , G01N21/95 , G01N21/9501 , G01N21/9506 , G01N2021/8864 , G01N2201/06153 , G01N2201/0683
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到物品的表面上的光子发射器，被配置为从制品的表面特征接收光子的光子检测器阵列; 以及处理装置，其被配置用于处理对应于从所述表面特征散射的光子和从所述表面特征发荧光的光子的光子检测器阵列信号，其中所述处理装置还被配置为对所述物品的表面特征进行分类。
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公开(公告)号：US20140104603A1
公开(公告)日：2014-04-17
申请号：US14053493
申请日：2013-10-14
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Florin Zavaliche , David M. Tung , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , Stephen Keith McLaurin
IPC: G01N21/95
Abstract: An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article.
Abstract translation: 公开了一种用于检测表面特征的装置。 该装置可以包括被配置为容纳光并且进一步被配置为将光从光源透射到物品的表面的多个股线。 该装置还可以包括检测器，其被配置为经由多个股线接收从物品的表面反射的光，其中该检测器还被配置为检测与该物品相关联的特征。
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