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1.发明授权公开(公告)号：US10689286B2
公开(公告)日：2020-06-23
申请号：US15867574
申请日：2018-01-10
Applicant: Seagate Technology LLC
Inventor： David Marcus Tung , Donald E. Curtiss , Henry Luis Lott , Valeriu Rusu , Mitchell Tomio Inouye , Gabriel V. Sapinoso , Joachim Walter Ahner
Abstract: A method includes cutting an outer diameter into a glass substrate. An inner diameter within the outer diameter is also cut into the glass substrate. A first region inside the outer diameter and a second region inside the inner diameter are heated. The second region inside the inner diameter is cooled, wherein the cooling causes the second region to detach from the first region.
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公开(公告)号：US20140152804A1
公开(公告)日：2014-06-05
申请号：US14029725
申请日：2013-09-17
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Travis William Grodt , Florin Zavaliche , Maissarath Nassirou , David M. Tung , Tchernio T. Boytchev , Stephen Keith McLaurin , Henry Luis Lott
IPC: G06K9/20
CPC classification number: G06T3/4069 , G06T7/0004 , G06T2207/10016 , G06T2207/30164
Abstract: Provided herein is an apparatus comprising a photon detecting array configured to take images of an article, and a mount configured to mount and translate the article in a direction by a sub-pixel distance. In some embodiments, the sub-pixel distance is based on a pixel size of the photon detecting array.
Abstract translation: 本文提供了一种装置，其包括被配置为拍摄物品的图像的光子检测阵列和被配置成沿着子像素距离的方向安装和平移物品的安装件。 在一些实施例中，子像素距离基于光子检测阵列的像素大小。
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公开(公告)号：US20140098368A1
公开(公告)日：2014-04-10
申请号：US14032192
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , David M. Tung , Florin Zavaliche , Stephen Keith McLaurin
IPC: G01N21/47
CPC classification number: G01N21/4738 , G01N21/95 , G01N2021/4764 , G01N2021/4792 , G01N2201/0635 , G01N2201/0683
Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。
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公开(公告)号：US20140098364A1
公开(公告)日：2014-04-10
申请号：US14032187
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/95
CPC classification number: G01N21/6456 , G01N21/47 , G01N21/63 , G01N21/64 , G01N21/8851 , G01N21/94 , G01N21/95 , G01N21/9501 , G01N21/9506 , G01N2021/8864 , G01N2201/06153 , G01N2201/0683
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到物品的表面上的光子发射器，被配置为从制品的表面特征接收光子的光子检测器阵列; 以及处理装置，其被配置用于处理对应于从所述表面特征散射的光子和从所述表面特征发荧光的光子的光子检测器阵列信号，其中所述处理装置还被配置为对所述物品的表面特征进行分类。
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公开(公告)号：US10024790B2
公开(公告)日：2018-07-17
申请号：US14046596
申请日：2013-10-04
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
Abstract: Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article.
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Patent Agency Ranking
公开(公告)号：US09810633B2
公开(公告)日：2017-11-07
申请号：US15047563
申请日：2016-02-18
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/6456 , G01N21/47 , G01N21/63 , G01N21/64 , G01N21/8851 , G01N21/94 , G01N21/95 , G01N21/9501 , G01N21/9506 , G01N2021/8864 , G01N2201/06153 , G01N2201/0683
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
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公开(公告)号：US20160274037A1
公开(公告)日：2016-09-22
申请号：US15166091
申请日：2016-05-26
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/956 , G01N21/94
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
Abstract translation: 本文提供了一种装置，其包括被配置为在物品的表面上顺序地发射第一组光子和第二组光子的光子发射器。 此外，光子检测器阵列被配置为将从物品的表面特征散射的第一组光子聚焦在第一焦平面中。 光子检测器阵列还被配置为将从物品的表面特征散射的第二组光子聚焦在第二焦平面中，其中散射的第一组光子不同于散射的第二组光子。 光子检测器阵列还被配置为提供用于区分制品的异物表面特征与物品的天然表面特征的信息。
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公开(公告)号：US20160178513A1
公开(公告)日：2016-06-23
申请号：US15053946
申请日：2016-02-25
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , David M. Tung , Florin Zavaliche , Stephen Keith McLaurin
IPC: G01N21/47
CPC classification number: G01N21/4738 , G01N21/95 , G01N2021/4764 , G01N2021/4792 , G01N2201/0635 , G01N2201/0683
Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。
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公开(公告)号：US09297759B2
公开(公告)日：2016-03-29
申请号：US14032187
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/6456 , G01N21/47 , G01N21/63 , G01N21/64 , G01N21/8851 , G01N21/94 , G01N21/95 , G01N21/9501 , G01N21/9506 , G01N2021/8864 , G01N2201/06153 , G01N2201/0683
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到物品的表面上的光子发射器，被配置为从制品的表面特征接收光子的光子检测器阵列; 以及处理装置，其被配置用于处理对应于从所述表面特征散射的光子和从所述表面特征发荧光的光子的光子检测器阵列信号，其中所述处理装置还被配置为对所述物品的表面特征进行分类。
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公开(公告)号：US09863892B2
公开(公告)日：2018-01-09
申请号：US15166091
申请日：2016-05-26
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/00 , G01N21/94 , G01N21/95 , G01N21/956
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
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