Invention Grant
- Patent Title: Method, apparatus and system for portable device surface and material analysis
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Application No.: US14712658Application Date: 2015-05-14
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Publication No.: US09880046B2Publication Date: 2018-01-30
- Inventor: Amardeep Sathyanarayana , Nitish Murthy , Sourabh Ravindran , Brian Paul Burk
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Gregory J. Albin; Charles A. Brill; Frank D. Cimino
- Main IPC: G01H1/00
- IPC: G01H1/00 ; G01H13/00 ; G01H3/08

Abstract:
A method and apparatus for determining properties of at least one of a surface or materials adjacent to a portable device. The method includes windowing a segment of the received signal to remove an edge transients, computing the FFT power spectral density of the signal, determining a peak in the spectral energy at a frequency, finding local peaks by determining the difference in the signal amplitude is relation to a pre-determined threshold, and computing harmonic energy according to the local peaks and the difference and determining at least one property of the surface or material.
Public/Granted literature
- US20150330831A1 METHOD, APPARATUS AND SYSTEM FOR PORTABLE DEVICE SURFACE AND MATERIAL ANALYSIS Public/Granted day:2015-11-19
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