Invention Grant
- Patent Title: Techniques and circuits for testing a virtual power supply at an integrated circuit device
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Application No.: US13946107Application Date: 2013-07-19
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Publication No.: US09891271B2Publication Date: 2018-02-13
- Inventor: Russell Schreiber , Joel Irby , Sudha Thiruvengadam , Carl Dietz
- Applicant: Advanced Micro Devices, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01R31/04
- IPC: G01R31/04 ; G01R31/26 ; G01R31/28
Abstract:
A power grid provides power to one or more modules of an integrated circuit device via a virtual power supply signal. A test module is configured to respond to assertion of a test signal so that, when the power grid is working properly and is not power gated, an output of the test module matches the virtual power supply. When the power grid is not working properly, the output of the test module is a fixed logic signal that does not vary based on the power gated state of the one or more modules.
Public/Granted literature
- US20150022218A1 TECHNIQUES AND CIRCUITS FOR TESTING A VIRTUAL POWER SUPPLY AT AN INTEGRATED CIRCUIT DEVICE Public/Granted day:2015-01-22
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