Invention Grant
- Patent Title: Edge detectors and systems of analyzing signal characteristics including the same
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Application No.: US15206384Application Date: 2016-07-11
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Publication No.: US09893721B2Publication Date: 2018-02-13
- Inventor: Dong-Seok Lee , Woo-Seok Kim , Jae-Jin Park , Dong-Hyuk Lim , Dae-Young Chung
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2015-0145209 20151019
- Main IPC: H03K5/1534
- IPC: H03K5/1534 ; H04L7/00 ; H03K19/21 ; H01L27/118

Abstract:
An edge detector includes a differential signal generator, a sense amplifier and a latch. The differential signal generator delays an input signal to generate a first differential signal and inverts the input signal to generate a second differential signal. The sense amplifier amplifies a difference between the first differential signal and the second differential signal to generate a first amplification signal and a second amplification signal at a first edge of a test clock signal and resets the first amplification signal and the second amplification signal at a second edge of the test clock signal. The latch generates an edge signal corresponding to edge information of the input signal in response to the first amplification signal and the second amplification signal.
Public/Granted literature
- US20170111035A1 EDGE DETECTORS AND SYSTEMS OF ANALYZING SIGNAL CHARACTERISTICS INCLUDING THE SAME Public/Granted day:2017-04-20
Information query
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