- Patent Title: Automatic analyzer and method for washing sample-pipetting probe
-
Application No.: US14366079Application Date: 2012-12-14
-
Publication No.: US09897519B2Publication Date: 2018-02-20
- Inventor: Naoto Suzuki , Yoshiaki Saito , Yoichi Aruga , Toshihide Orihashi , Kazuhiro Nakamura
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-284472 20111226
- International Application: PCT/JP2012/082561 WO 20121214
- International Announcement: WO2013/099660 WO 20130704
- Main IPC: G01N1/34
- IPC: G01N1/34 ; G01N35/10 ; G01N35/00 ; G01N1/00

Abstract:
When the type is to be changed from serum (preceding sample) to urine (current sample), “serum” is set to a preceding type and “urine” is set to a measurement type at number 1 in a condition number. At condition number 1, the wash type is pattern 1, with washing performed once with detergent 1. Where the preceding sample is serum and the current sample is CSF, the condition number is 2 and the wash type is pattern 2, with washing performed twice using detergent 1 and once with detergent 2. Where the preceding sample is urine and the current sample is CSF, the condition number is 3 and the wash type is pattern 3, with washing performed once with detergent 1, once with detergent 2, and once with water. In the case of pattern 4, washing is performed three times with detergent 1.
Public/Granted literature
- US20140363896A1 AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE Public/Granted day:2014-12-11
Information query